An apparatus for the rapid preparation of thin-foil specimens for direct examination in the electron microscope

Taylor, Jim; Watkins, Rachel

doi:10.1016/0047-7206(69)90023-5

Micron (1969)

1969

DOI: 10.1016/0047-7206(69)90023-5

|View full text |Cite

An apparatus for the rapid preparation of thin-foil specimens for direct examination in the electron microscope

Jim Taylor¹,

Rachel Watkins²

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

Supporting

Mentioning

Contrasting

Year Published

1972

1978

Publication Types

Select...

Article2

Relationship

Self Cite0

Independent2

Authors

Journals

Cited by 2 publications

References 1 publication

Supporting

Mentioning

Contrasting

Order By: Relevance

scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.

Contact Info

customersupport@researchsolutions.com

10624 S. Eastern Ave., Ste. A-614

Henderson, NV 89052, USA

Blog Terms and Conditions API Terms Privacy Policy Contact Cookie Preferences Do Not Sell or Share My Personal Information

Made with 💙 for researchers

Part of the Research Solutions Family.

An apparatus for the rapid preparation of thin-foil specimens for direct examination in the electron microscope

Cited by 2 publications

References 1 publication

An improved jet thinning apparatus for the preparation of Si-Ge alloy foils

An improved jet thinning apparatus for the preparation of Si-Ge alloy foils

Modified double-jet electrolytic thinning technique for transmission electron microscopy

Contact Info

Product

Resources

About