2012
DOI: 10.5121/vlsic.2012.3101
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An Analytical Model for Fringing Capacitance in Double gate Hetero Tunnel FET and Analysis of effect of Traps and Oxide charges on Fringing Capacitance

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Cited by 2 publications
(2 citation statements)
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“…To replace conventional MOSFET, new device structures are being investigated which must be compatible to CMOS circuit architecture and technology. Due to their low sub threshold swing (SS<60mv/dec), less susceptibility to short channel effects (SCEs), very low leakage current, Tunnel Field Effect Transistor (TFET) has been considered as an alternative for low power CMOS applications [4][5][6][7][8][9][10][11][12].…”
Section: Introductionmentioning
confidence: 99%
“…To replace conventional MOSFET, new device structures are being investigated which must be compatible to CMOS circuit architecture and technology. Due to their low sub threshold swing (SS<60mv/dec), less susceptibility to short channel effects (SCEs), very low leakage current, Tunnel Field Effect Transistor (TFET) has been considered as an alternative for low power CMOS applications [4][5][6][7][8][9][10][11][12].…”
Section: Introductionmentioning
confidence: 99%
“…However ON current of the TFET is still not adequate to compete with the MOSFET. Only few methods such as gate-drain under lap [6], heterogeneous gate (HG) dielectric (with high-k material at the source side and low-k at the drain end) [7], [8], using a spacer to separate gate and drain [9], and lower drain doping [10] are proposed to reduce the ambipolarity of the device. In this work, to enhance the ON current and reduce the ambipolarity, symmetric halo-doped DG-TFET has been proposed.…”
mentioning
confidence: 99%