1993
DOI: 10.1109/22.245685
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An analytical method for direct calculation of E and H-field patterns of conductor-backed coplanar waveguides

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Cited by 23 publications
(10 citation statements)
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“…If a cross-sectional model consists of three analysis regions, CI, CII, or CIII represents the line capacitance of Regions 1-3, respectively. Then, the characteristic line impedance can be obtained by using (25), and the effective permittivity eff can be expressed as (26), where C I ′ , C II ′ , and C III ′ are the capacitances with air filling.…”
Section: Characteristic Line Impedancementioning
confidence: 99%
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“…If a cross-sectional model consists of three analysis regions, CI, CII, or CIII represents the line capacitance of Regions 1-3, respectively. Then, the characteristic line impedance can be obtained by using (25), and the effective permittivity eff can be expressed as (26), where C I ′ , C II ′ , and C III ′ are the capacitances with air filling.…”
Section: Characteristic Line Impedancementioning
confidence: 99%
“…For the optimal impedance matching, the characteristic line impedance values along the transition length can be specified. Then, the design parameters to attain the specific characteristic line impedance at a certain location of the transition can be obtained by an inverse relation of (25).…”
Section: Characteristic Line Impedancementioning
confidence: 99%
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“…[1][2][3] Currently, they are widely used in commercial and military devices, such as domestic microwave ovens, satellites, mobile phones, messaging apparatuses, palmtops, organizers, as well as fighter planes, rockets, and warships via military stealth technology. 1,7,8 To achieve this type of thin soft magnetic film, different sputtering systems are usually employed. 1,7,8 To achieve this type of thin soft magnetic film, different sputtering systems are usually employed.…”
Section: Introductionmentioning
confidence: 99%
“…The numerical formulas based on SDA were presented in [7] for the analysis of the quasi-TEM parameters of CBCPW structures. A direct method of calculating the electromagnetic field patterns surrounding the CBCPW was proposed by Gillick et al [8]. The dispersion characteristics of the finite-width CBCPW were obtained by rigorous full-wave mode-matching method incorporating the metal modes [9].…”
Section: Introductionmentioning
confidence: 99%