2006
DOI: 10.1016/j.physleta.2006.04.037
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An analytical expression for electron elastic scattering cross section from atoms and molecules in 1.0 keV to 1.0 MeV energy range

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Cited by 12 publications
(13 citation statements)
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“…The best fit to the data, with a R 2 value of 0.997, was a = 0.245, b = −1.665, and c = 2.81, plotted in Figure 5A together with the experimental data. This function can be used to estimate the critical exposure at 300 kV; the critical exposure at 200 kV can be expected to be about 25% lower ( Yalcin et al, 2006 ). The optimal exposure, plotted in Figure 5B , is ∼2.5 times the critical exposure ( Hayward and Glaeser, 1979 ).…”
Section: Resultsmentioning
confidence: 99%
“…The best fit to the data, with a R 2 value of 0.997, was a = 0.245, b = −1.665, and c = 2.81, plotted in Figure 5A together with the experimental data. This function can be used to estimate the critical exposure at 300 kV; the critical exposure at 200 kV can be expected to be about 25% lower ( Yalcin et al, 2006 ). The optimal exposure, plotted in Figure 5B , is ∼2.5 times the critical exposure ( Hayward and Glaeser, 1979 ).…”
Section: Resultsmentioning
confidence: 99%
“…3 allows for selection of an exposure to maximize the SNR at any resolution. Although the amount of radiation damage per useful elastic interaction is not expected to change between 200 and 300 kV (Henderson, 1995), at 300 kV an exposure that is $25% higher would be required for the same number of elastic interactions to occur (Yalcin et al, 2006), resulting in higher critical and optimal exposures at that voltage.…”
Section: Resultsmentioning
confidence: 99%
“…This optimal exposure estimate assumes minimal detector and structural noise; for real samples and detectors, the optimal exposure is probably slightly lower. At 300 kV, 120 kV, and 100 kV, critical and optimal exposures would be $25% higher, $30% lower, and $40% lower, respectively (Henderson, 1995;Yalcin et al, 2006).…”
Section: Resultsmentioning
confidence: 99%
“…The mean free paths of both elastically and inelastically scattered electrons are significantly decreased at accelerating voltages of 200 kV and 100 kV compared to 300 kV (Yalcin et al, 2006;Angert et al, 1996;Yonekura et al, 2006), which is the highest voltage in the current high-end cryo-electron microscopes. Inelastically scattered electrons cause radiation damage to biological samples.…”
Section: Electron Energy and Energy Filteringmentioning
confidence: 96%