1999
DOI: 10.1109/55.772371
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An analytical approximation for the excess noise factor of avalanche photodiodes with dead space

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Cited by 19 publications
(22 citation statements)
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“…This suggests that the gain variance is small, hence it begins almost deterministic. This can be explained by looking at the excess noise factor when the dead space is not negligible anymore 28 . The dead space is indeed defined as d ¼ E i /qF, where E i is the ionization threshold energy, q the elementary charge and F the electric field strength.…”
Section: Resultsmentioning
confidence: 99%
“…This suggests that the gain variance is small, hence it begins almost deterministic. This can be explained by looking at the excess noise factor when the dead space is not negligible anymore 28 . The dead space is indeed defined as d ¼ E i /qF, where E i is the ionization threshold energy, q the elementary charge and F the electric field strength.…”
Section: Resultsmentioning
confidence: 99%
“…For reducing the excess noise that arises from the avalanche process, the multiplication region width should be shortened [2][3][4][5][6]. There has been a widespread research effort in the modeling of avalanche photodiodes (APDs) with a thin multiplication layer, which includes the effect of dead space [4][5][6][7][8][9][10][11][12][13][14][15]. However, only a few works have attempted to introduce closed formula models considering the effects of dead space for the calculation of the characteristics of APDs [7,8,12,13].…”
Section: Introductionmentioning
confidence: 99%
“…There has been a widespread research effort in the modeling of avalanche photodiodes (APDs) with a thin multiplication layer, which includes the effect of dead space [4][5][6][7][8][9][10][11][12][13][14][15]. However, only a few works have attempted to introduce closed formula models considering the effects of dead space for the calculation of the characteristics of APDs [7,8,12,13]. Based on a firstorder expansion of the recursive equations reported in [11], Spinelli et al [8] derived an approximate analytical expression for the mean gain by using a small-perturbation approach.…”
Section: Introductionmentioning
confidence: 99%
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