Proceedings of IEEE 48th Annual Symposium on Frequency Control
DOI: 10.1109/freq.1994.398318
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An analysis of the SAW displacements in quartz and lithium niobate by X-ray topography

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“…Using high-resolution X-ray diffraction, amplitudes and wavelengths of acoustic wave can be determined, acoustic waves attenuation in the crystal depth and along their propagation direction can be measured by the analysis of their X-ray diffraction spectra [6][7][8][9][10]. Stroboscopic X-ray topography, like SEM, permits direct imaging of an acoustic wave field in the real time mode [6,[11][12][13][14]. Direct imaging of traveling SAW by stroboscopic X-ray topography is based on focusing of X-ray radiation by the SAW minima.…”
Section: Introductionmentioning
confidence: 99%
“…Using high-resolution X-ray diffraction, amplitudes and wavelengths of acoustic wave can be determined, acoustic waves attenuation in the crystal depth and along their propagation direction can be measured by the analysis of their X-ray diffraction spectra [6][7][8][9][10]. Stroboscopic X-ray topography, like SEM, permits direct imaging of an acoustic wave field in the real time mode [6,[11][12][13][14]. Direct imaging of traveling SAW by stroboscopic X-ray topography is based on focusing of X-ray radiation by the SAW minima.…”
Section: Introductionmentioning
confidence: 99%