2011
DOI: 10.2186/ajps.3.336
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An Analysis of Fused Interface between Veneering Porcelain and Zirconia

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(1 citation statement)
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“…The existence of a reaction layer at the bonding interface between Ce-TZP/Al2O3 and porcelain could not be ruled out as conclusively as in previous reports which observed TZP/porcelain interface using micro X-ray diffraction (µXRD) 18,19) , energy-dispersive X-ray spectroscopy (EDS) 20,21) , and WDS 15,22) . Due to insufficient resolution in these studies, the interfacial transition layer could only be declared as non-existent with a caveat.…”
Section: Discussionmentioning
confidence: 69%
“…The existence of a reaction layer at the bonding interface between Ce-TZP/Al2O3 and porcelain could not be ruled out as conclusively as in previous reports which observed TZP/porcelain interface using micro X-ray diffraction (µXRD) 18,19) , energy-dispersive X-ray spectroscopy (EDS) 20,21) , and WDS 15,22) . Due to insufficient resolution in these studies, the interfacial transition layer could only be declared as non-existent with a caveat.…”
Section: Discussionmentioning
confidence: 69%