An alternative method for transistor low frequency noise estimation by measuring phase noise of test oscillator

Phase noise amplitude distribution as indicator of origin of random phase perturbation in a test oscillator

“…Extensive investigation of phase noise indicate that white noise sources in all types of oscillators give rise to a phase noise power spectrum proportional to 1/(∆ω) 2 , where ∆ω is the offset frequency with respect to the carrier frequency [1], [2]. This trend is valid for offset frequencies as high as several percent of the carrier frequency.…”

“…1. ) with HEMT is simulated and designed [2]. For the purpose of analysis of the test oscillator properties we have simulated phase noise time distribution which is a consequence of noise perturbation.…”

“…Thus, frequency noise ∆ω(t), can be assumed white in such a band. The autocorrelation of ∆ω (t) is given by (2) where D φ -is diffusivity and δ(t) -Delta function. The probability density of φ(t) represents a Gaussian distribution centered at φ(0).…”

“…Thus traditional SPICE analyses cannot be used for estimating noise in mixers or oscillators. Special techniques have been developed for oscillator phase noise [1], [2]. If small signal perturbational analysis is applied to oscillatory circuits the resulting perturbation increase strongly with time, the noise variance increases also with time.…”