Abstract:Backside illuminated technologies have been used in complementary metal–oxide–semiconductor image sensors for years and are finding a renewed interest and are being investigated for imagers and detectors in light detection and ranging applications. Coupled with the improved performance facilitated through 3D integration, the thinning of bonded wafers has become a crucial processing step. In this study, an alternate and potentially more cost-effective method has been explored using an HNA (hydrofluoric, nitric,… Show more
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