Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270)
DOI: 10.1109/test.1998.743305
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An almost full-scan BIST solution-higher fault coverage and shorter test application time

Huan-Chih Tsai
1
,
Sudipta Bhawmik2,
K.-T. Cheng3
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Cited by 12 publications
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