An advanced unscented Kalman filter algorithm for parameter estimation in continuous-time sigma-delta modulators

Lorenz, Matthias; Bruuckner, Timon; Anders, Jens; Ortmanns, Maurits

doi:10.1109/icecs.2013.6815472

Cited by 1 publication

(1 citation statement)

References 6 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The architecture was reused from our prior implementation in [26]. A single architecture can be used in this paper without loss of generality because the UKF based estimation was previously shown to be working on various filter implementations and quantizer resolutions [22]- [24]. Additionally, also the application on discrete-time (DT) modulators is possible without restrictions to the generality of the approach.…”

Section: Modulatorsmentioning

confidence: 99%

Estimation of Non-Idealities in Sigma-Delta Modulators for Test and Correction Using Unscented Kalman Filters

Lorenz

Ritter

Anders

et al. 2015

IEEE Trans. Circuits Syst. I

Self Cite

View full text Add to dashboard Cite

In this paper, an enhanced unscented Kalman filter is used for the estimation of non-idealities in sigma-delta modulators. As sigma-delta modulator based analog-to-digital converters are known to be prone to performance degradation from many circuit non-idealities, testing and selection of the manufactured chips as well as post-correction procedures are required to ensure a reliable performance. In contrast to most state-of-the art techniques, the proposed estimator is capable of simultaneously tracking a large set of non-ideal parameters with high accuracy and in a very short offline time within the range of microseconds. Three possible implementations are proposed and it is shown how the technique is used to perform an in situ non-ideality estimation and subsequent calibration of a manufactured chip, bringing the modulator back into its designed performance range. It is further demonstrated that the estimator can reliably detect the non-idealities over a wide range when intentionally degrading the performance of the chip by manually sweeping its trimming parameters. The presented hardware measurement results prove that the proposed technique is practically applicable to the test and/or calibration of sigma-delta data converters.

show abstract

Section: Modulatorsmentioning

confidence: 99%