An additional S-shaped structure for sensitivity improvement of coaxial probe for permittivity determination of low loss materials

Jiao, Xingmin; Jin, Wei; Yang, Xiaoqing

doi:10.1088/0957-0233/26/5/055701

Cited by 2 publications

(2 citation statements)

References 22 publications

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“…These features have made coaxial probes as useful tools for quantitative testing and nondestructive evaluation in microwave engineering, biomedicine, agriculture, geotechnology, etc. [9][10][11][12][13][14][15].…”

Section: Introductionmentioning

confidence: 99%

Fast and Stable Integration Method for the Aperture Admittance of an Open-Ended Coaxial Probe Terminated Into Low-Loss Dielectrics

Zhou¹,

Ju²,

Wang³

et al. 2017

PIER M

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Abstract-Theutilization of an open-ended coaxial probe for characterization of dielectric properties or quantitative nondestructive detection of defects in materials firstly requires evaluating the aperture admittance. For the case that the probe is terminated into low-loss dielectrics backed by a conducting sheet, however, the admittance expression encounters poles in the vicinity of the path of integration, resulting in low convergence rate or even overflow in numerical quadrature. In this study, locations and properties of the singularities of the integral formulation for generally lossy, low-loss, and lossless dielectric slabs backed by a perfectly conducting sheet are investigated above all. Subsequently, making use of the contour integral technique, a fast and stable integration method is put forward to calculate the admittance integral formulation. Finally, numerical experiments are conducted to justify the validity and efficiency of the proposed integration method for low-loss dielectric cases by comparison with the traditional integration method as well as commercial FEM software.

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Section: Introductionmentioning

confidence: 99%

Fast and Stable Integration Method for the Aperture Admittance of an Open-Ended Coaxial Probe Terminated Into Low-Loss Dielectrics

Zhou¹,

Ju²,

Wang³

et al. 2017

PIER M

View full text Add to dashboard Cite

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“…Therefore, it is essential to understand the relationship between temperature and CP for further study of the microwave heating process. Details of CP measurement at various temperatures for some of the materials presented here can be found in [5][6][7][8][9][10][11]. The CP of a material over variable temperatures can be obtained using several microwave devices, such as a di electric resonator, coplanar waveguide and coaxial line.…”

Section: Introductionmentioning

confidence: 99%

A simple method to measure the complex permittivity of materials at variable temperatures

Yang

Yin

Liu

et al. 2017

Meas. Sci. Technol.

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Measurement of the complex permittivity (CP) of a material at different temperatures in microwave heating applications is difficult and complicated. In this paper a simple and convenient method is employed to measure the CP of a material over variable temperature. In this method the temperature of a sample is increased experimentally to obtain the formula for the relationship between CP and temperature by a genetic algorithm. We chose agar solution (sample) and a Yangshao reactor (microwave heating system) to validate the reliability and feasibility of this method. The physical parameters (the heat capacity, Cp, density, ρ, and thermal conductivity, k) of the sample are set as constants in the process of simulation and inversion. We analyze the influence of the variation of physical parameters with temperature on the accuracy of the inversion results. It is demonstrated that the variation of these physical parameters has little effect on the inversion results in a certain temperature range.

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An additional S-shaped structure for sensitivity improvement of coaxial probe for permittivity determination of low loss materials

Cited by 2 publications

References 22 publications

Fast and Stable Integration Method for the Aperture Admittance of an Open-Ended Coaxial Probe Terminated Into Low-Loss Dielectrics

Fast and Stable Integration Method for the Aperture Admittance of an Open-Ended Coaxial Probe Terminated Into Low-Loss Dielectrics

A simple method to measure the complex permittivity of materials at variable temperatures

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