1994
DOI: 10.1007/bf01244563
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An accurate computer correction program for quantitative electron probe microanalysis

Abstract: Abstract. The aim of this paper is to present a practical and accurate program of correction based on a new mathematical description of q~(pz), which allows a global correction combining atomic number and absorption correction [ZA]. Key words: EPMA, computer program, correction procedure, X-ray depth distribution.Electron probe microanalysis (EPMA) requires several corrections to quantify a specimen. These corrections allow to convert the measured intensity of the characteristic X-ray into elemental concentrat… Show more

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Cited by 310 publications
(146 citation statements)
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“…As an additional test, the geochemical composition was determined on several thin sections using a CAMECA SX-100 electron microprobe at the University de Montpellier II (France). Microprobe analysis correction is based on Merlet (1994). The microprobe analyses were consistent with the ICP-AES data for Ca, Mg, Mn, Fe, Sr and K, whereas the Al content determined by microprobe was slightly higher than that by ICP-AES.…”
Section: Methodssupporting
confidence: 68%
“…As an additional test, the geochemical composition was determined on several thin sections using a CAMECA SX-100 electron microprobe at the University de Montpellier II (France). Microprobe analysis correction is based on Merlet (1994). The microprobe analyses were consistent with the ICP-AES data for Ca, Mg, Mn, Fe, Sr and K, whereas the Al content determined by microprobe was slightly higher than that by ICP-AES.…”
Section: Methodssupporting
confidence: 68%
“…A special program, analyzing the alkalies first, was employed for feldspars. A new accurate computer correction program (Merlet, 1994) was used to calculate the elemental concentrations. The microprobe analyses are available on the CD-ROM in the back pocket of this volume, but representative analyses are given in Tables 2−7 at the end of this chapter.…”
Section: Methodsmentioning
confidence: 99%
“…Major element concentrations (Table 1) of individual grains picked from the mineral separates (cpx-Fe, cpx-Mg, plagioclase and ilmenite) of LAP 02205 were determined by wavelength-dispersive electron microprobe (EMP) using a focused beam with an acceleration voltage of 15 kV, 20 nA beam current, 20 sec peak count times, 2x10 sec count times for a two-sided background determination, a φ(ρΖ) data reduction (Merlet, 1994), and calibrated against natural mineral standards. The melt veins were analyzed under the same conditions but using a 20 µm diameter defocused beam.…”
Section: Major and Trace Element Analyses Of Mineral Separatesmentioning
confidence: 99%