2000
DOI: 10.1016/s0168-583x(99)00800-9
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Amorphization behaviors in polycrystalline alumina irradiated with energetic iodine ions

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Cited by 32 publications
(22 citation statements)
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“…[17,[19][20][21][22][23][24][25] justified the validity of Eq. (3) in sapphire with the g and a(0) values typical for insulators.…”
Section: Al 2 Omentioning
confidence: 93%
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“…[17,[19][20][21][22][23][24][25] justified the validity of Eq. (3) in sapphire with the g and a(0) values typical for insulators.…”
Section: Al 2 Omentioning
confidence: 93%
“…At the highest fluence they found d am = 4.5 lm and an average surface step of z = 0.65 lm [22], which were related to the amorphization [17]. They estimated S ei % 4-5 keV/nm at the amorphous-crystalline phase boundary and took this value for S et [17,22].…”
Section: Al 2 Omentioning
confidence: 99%
See 1 more Smart Citation
“…In 2000, Aruga et al [7] observed by the TEM technique an amorphization until a depth of 4.5 lm after the irradiation of polycrystalline alumina with iodine ions at energy of 0.7 MeV/amu for a fluence larger than 10 14 ions/cm 2 with an electronic energy loss threshold in agreement with the prediction of the thermal spike model [24]. In this paper, we report on the appearance of a total disorder at the surface of a-Al 2 O 3 , associated to the amorphization as seen by Aruga et al [7] for large fluence of Xe ions at energy of 0.7 MeV/amu.…”
Section: Introductionmentioning
confidence: 99%
“…Because of the excellent physicochemical properties for many industrial applications (hardness, chemical insensitivity, refractory behaviour, transparency over a wide wavelength range) of Al 2 O 3 , many investigations have been performed modifying the microstructural [1][2][3][4][5][6][7], surface state [8][9][10] and optical properties [11][12][13][14][15][16] induced in aAl 2 O 3 by ion irradiation in the electronic energy loss regime. These modifications result from complex interactions involving the slowing down process of the incident ions that induces defect creation and structural transformations in the host matrix [17].…”
Section: Introductionmentioning
confidence: 99%