1996 International Semiconductor Conference. 19th Edition. CAS'96 Proceedings
DOI: 10.1109/smicnd.1996.557473
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Aluminum nitride films for optical applications

Abstract: 3~ecasin S. A, , 4~~t i t~t e of Qptoelectronics I Bucharest Romania 3mw\;lry:Hard and adherent Am layers on glass have b e n deposited by reactive magnetron sputtering. The deposition rate, the structure and the optical properties have been investigated mainly with respect to possible optical applicatians .

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“…Its characteristics are a wide direct band gap (~6.3 eV), high thermal conductivity, good chemical and thermal stability, good dielectric properties, very fast Rayleigh velocity, 1 and a high refractive index (>2.1) in the visible light range. 2 The AlN film has a wide application in microelectronic devices because of its high thermal conductivity (320 w/mÁk), high electrical resistance, and attractive mechanical properties. 3 Because its thermal expansion coefficient is similar to that of Si, AlN film has potential applications for metal-insulator-semiconductor structures.…”
Section: Introductionmentioning
confidence: 99%
“…Its characteristics are a wide direct band gap (~6.3 eV), high thermal conductivity, good chemical and thermal stability, good dielectric properties, very fast Rayleigh velocity, 1 and a high refractive index (>2.1) in the visible light range. 2 The AlN film has a wide application in microelectronic devices because of its high thermal conductivity (320 w/mÁk), high electrical resistance, and attractive mechanical properties. 3 Because its thermal expansion coefficient is similar to that of Si, AlN film has potential applications for metal-insulator-semiconductor structures.…”
Section: Introductionmentioning
confidence: 99%