2019
DOI: 10.1088/2053-1583/ab0e24
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Alternative stacking sequences in hexagonal boron nitride

Abstract: The relative orientation of successive sheets, i.e. the stacking sequence, in layered two-dimensional materials is central to the electronic, thermal, and mechanical properties of the material. Often different stacking sequences have comparable cohesive energy, leading to alternative stable crystal structures. Here we theoretically and experimentally explore different stacking sequences in the van der Waals bonded material hexagonal boron nitride (h-BN). We examine the total energy, electronic bandgap, and die… Show more

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Cited by 94 publications
(122 citation statements)
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“…Stacking the layers of h-BN in different ways yields different material properties without altering the structure within each layer [6][7][8][9]. The trivial stacking sequence [ Figure 1(a)] is named the AA stacking, where there is no in-plane shift or rotation between consecutive lay- Figure 1.…”
Section: Introductionmentioning
confidence: 99%
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“…Stacking the layers of h-BN in different ways yields different material properties without altering the structure within each layer [6][7][8][9]. The trivial stacking sequence [ Figure 1(a)] is named the AA stacking, where there is no in-plane shift or rotation between consecutive lay- Figure 1.…”
Section: Introductionmentioning
confidence: 99%
“…Common synthesis methods yield a bilayer stacking sequence [ Figure 1(b)], named the AA stacking, where there is a 60 • rotation between consecutive layers, which results in columns of alternating B and N atoms in the bulk [10]. An alternative stacking sequence, where there is a shift but no rotation between consecutive layers [ Figure 1(c,d)], named the AB stacking, had been observed in rare cases until recently [11][12][13] robust and reproducible method of growing AB stacked h-BN (AB-h-BN) [9]. Many computed properties of ABh-BN are similar to those of AA -h-BN, such as interlayer distance (AB: 3.09Å vs. AA : 3.11Å), indirect band gap (AB: 4.43 eV vs. AA : 4.41 eV) and dielectric tensor [9].…”
Section: Introductionmentioning
confidence: 99%
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