Alternating current (AC) impedance imaging with combined atomic force scanning electrochemical microscopy (AFM-SECM)

Mesoscopic impedance analysis of solid materials’ surface

“…Shape of the curve in Fig. 9 representing impedance characteristics in Bode projection is well correlated with elaborated model developed in [19]. Equivalent circuit proposed by O'Hayre et al for the case of the tip sample contact consists of resistance of probe tip including resistance of conducting path in cantilever and probe body.…”

“…Jorcin et al [18] used local electrochemical impedance mapping in research of deterioration of organic coatings. Eckhard et al [19] shown possibility of utilization of AFM scanning with simultaneous microelectrode impedance measurements. Kalinin et al [20][21][22] presented combination of atomic force microscopy with ac electric measurements (AFM-IS) to characterize transport properties of nanodevices.…”

Investigation of Localized Catalytic and Electrocatalytic Processes and Corrosion Reactions with Scanning Electrochemical Microscopy (SECM)

“…AC measurements thus seem to be an adequate tool to elucidate local corrosion phenomena, although Baranski and Diakowski [253] have shown that the origin of the contrast in AC images is not always clear because of the complexity of the equivalent circuits that are necessary to interpret first and second order impedance measurements. Applications of this method in corrosion science are still limited to model samples and comprise investigations of lacquered tinplates [219], oxide films on a NiTi shape memory alloy [254,255], stainless steel [220], stripping voltammetry experiments on Cu particles [256], and AC measurements with SECM probes integrated into SFM cantilevers [257]. The group of Schuhmann and coworkers currently endeavours to overcome the problems in interpretation of the AC measurements by recording frequency spectra at each point of an image as well as at different tip-substrate separations [258].…”

Scanning electrochemical impedance microscopy for investigation of glucose oxidase catalyzed reaction

“…In this technique the AFM-based topography and alternating current SECM (AC-SECM) based signals are recorded simultaneously with ring-shaped microelectrode, which is integrated on the AFM probe. Structured glass/gold substrate was evaluated by such advanced AFM probe and significant increase of current was registered when the probe was placed over spots consisting of gold [11].…”

“…In addition comparison of conventional EIS with localized EIS was done during the investigation of degradation of polyester coil-coated galvanized steel [8] and in the evaluation of the degradation of some coatings, which were based on deposited organic compounds or polymeric layers [9,10]. Another alternative technique, which was used for the determination of localized EIS data, is an impedance imaging combined with atomic force scanning electrochemical microscopy (AFM-SECM) [11]. In this technique the AFM-based topography and alternating current SECM (AC-SECM) based signals are recorded simultaneously with ring-shaped microelectrode, which is integrated on the AFM probe.…”