2024
DOI: 10.1039/d4ce00191e
|View full text |Cite
|
Sign up to set email alerts
|

AlN interlayer-induced reduction of dislocation density in the AlGaN epilayer

David Maria Tobaldi,
Luc Lajaunie,
Arianna Cretì
et al.

Abstract: The emerging ultrawide-bandgap AlGaN alloy system holds promise for the development of advanced materials in the next generation of power semiconductor and UV optoelectronic devices. Within this context, heterostructures based...

Help me understand this report
View preprint versions

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Publication Types

Select...

Relationship

0
0

Authors

Journals

citations
Cited by 0 publications
references
References 40 publications
0
0
0
Order By: Relevance

No citations

Set email alert for when this publication receives citations?