2019
DOI: 10.1016/j.ceramint.2018.12.038
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All-inorganic perovskite Cs4PbBr6 thin films in optoelectronic resistive switching memory devices with a logic application

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Cited by 39 publications
(34 citation statements)
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“…The X‐ray diffraction (XRD) result verifies the crystallization of the as‐grown thin films, as shown in Figure a, which indicates the thin films match a highly crystalline rhombohedral Cs 4 PbBr 6 phase (JPCDS No. 73‐2478) with a space group of R3c . Meanwhile, it is noted that a small peak marked with a red square in XRD spectra could be assigned to trace amount of impurities of orthorhombic CsPbBr 3 .…”
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confidence: 98%
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“…The X‐ray diffraction (XRD) result verifies the crystallization of the as‐grown thin films, as shown in Figure a, which indicates the thin films match a highly crystalline rhombohedral Cs 4 PbBr 6 phase (JPCDS No. 73‐2478) with a space group of R3c . Meanwhile, it is noted that a small peak marked with a red square in XRD spectra could be assigned to trace amount of impurities of orthorhombic CsPbBr 3 .…”
mentioning
confidence: 98%
“…Some researches approved that the RS performances in devices based on all‐inorganic perovskites were more stable as compared with organic perovskites materials. So, promoting all‐inorganic perovskite‐based memory devices would further satisfy requirement in fashionable RS field …”
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confidence: 99%
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