All-digital 0.016mm² reconfigurable sensor-ADC using 4CKES-TAD in 65nm digital CMOS

Abstract

An all-digital reconfigurable (10-to-16-bit) sensor ADC based on TAD (Time A/D converter) is completely digital, using a ring-delay-line RDL driven by an input voltage V in as its power supply. This method realized 16.2bit/100ksps/37.5μW from 0.6V supply without any static current using a 0.016mm 2 prototype 4CKES (4-clock-edge-shift) TAD in a 65nm digital CMOS. Resolutions can be controlled by setting its conversion time T cv . A 13.8bit/1Msps/75.4μW or 10.5bit/10Msps/93.2μW operation is also experimentally confirmed using 0.6V supply. Finally, correction of nonlinearity characteristics has been discussed using differential-setup processing method. I.978-1-4799-4242-8/14/$31.00 c 2014 IEEE

An efficient voltage to delay conversion method for DCVSL cells and its application in high speed all‐digital time‐based quantization

“…7 This method is more power and area efficient than other methods using additional element. The literature [7][8][9][10] proposed all-digital time-based ADCs by varying the supply voltage of PMOS transistors in CMOS inverters. As delay cells are the main blocks of time-based ADCs, choosing the right delay cell affects the overall performance of the ADC considerably.…”