Extended Abstracts of the 2015 International Conference on Solid State Devices and Materials 2015
DOI: 10.7567/ssdm.2015.ps-8-10
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AlGaN Microdisks on Top of Supporting GaN Columns Fabricated using Hydrogen Environment Anisotropic Thermal Etching

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“…In order to avoid this process, the template used for the SAG had a thin capping layer of 20 nm thick Al 0.15 Ga 0.85 N below the SiO x , which prevented decomposition due to its higher thermal stability. 26,32,36,37 Acquiring enough data points for a statistical study of the decomposition rate of microfins required dividing the experiment into three steps, i.e., two growth runs and one annealing process, each with its own set of measurements. Initially, a sample with GaN microfin cores was grown and characterized by using an Olympus OLS5000 confocal laser scanning microscope (LSM) to determine the width and height of all different structures.…”
Section: Methodsmentioning
confidence: 99%
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“…In order to avoid this process, the template used for the SAG had a thin capping layer of 20 nm thick Al 0.15 Ga 0.85 N below the SiO x , which prevented decomposition due to its higher thermal stability. 26,32,36,37 Acquiring enough data points for a statistical study of the decomposition rate of microfins required dividing the experiment into three steps, i.e., two growth runs and one annealing process, each with its own set of measurements. Initially, a sample with GaN microfin cores was grown and characterized by using an Olympus OLS5000 confocal laser scanning microscope (LSM) to determine the width and height of all different structures.…”
Section: Methodsmentioning
confidence: 99%
“…Note that in general, at these annealing conditions, the GaN buffer below the SiO x mask can suffer from decomposition, as shown by Coulon et al when performing selective area etching of nanoholes. In order to avoid this process, the template used for the SAG had a thin capping layer of 20 nm thick Al 0.15 Ga 0.85 N below the SiO x , which prevented decomposition due to its higher thermal stability. ,,, …”
Section: Methodsmentioning
confidence: 99%
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