Nickel manganite spinel thin films prepared by chemical solution deposition exhibit negative temperature coefficient of resistance (TCR) values between −3.3 and −4.5%/K. In contrast to bulk thermistors, dense films could be prepared completely within the spinel phase field. Thus, decomposition into the NiO phase and a Mn‐rich spinel, which is problematic in bulk ceramics, is minimized in thin films. For films prepared outside of the single‐phase field, phase separation cannot always be detected using X‐ray diffraction. In such cases, transmission electron microscopy is useful in identifying decomposition. It is found that the lattice parameters for films with compositions ranging between Mn/(Mn+Ni)=0.14 and 0.77 are smaller than the values reported for nickel manganite spinels, suggesting cation deficiency. Single‐phase spinel films are compared with single‐phase bixbyite films synthesized between 630° and 930°C. The bixbyite phase exhibits lower TCR and lower resistivity (TCR=−3.1 to −3.3%/K and resistivity values=400–1600 Ω·cm) compared with spinel (TCR=−3.6 to −4.1%/K and resistivity values=3500–21 000 Ω·cm). Composite films (achieved by controlling the pyrolysis to create a low local pO2 during annealing) show intermediate values (TCR=−3.0 to −3.8%/K and resistivity values=470–6600 Ω·cm).