Aging effects in interface-engineered perovskite solar cells with 2D nanomaterials: A depth profile analysis

Busby, Yan; Agresti, Antonio; Pescetelli, Sara; Carlo, Aldo Di; Noël, Céline; Pireaux, Jean‐Jacques; Houssiau, Laurent

doi:10.1016/j.mtener.2018.04.005

Cited by 51 publications

(55 citation statements)

References 42 publications

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“…The characteristic secondary ions for mapping have been selected based on a careful analysis of the ToF‐SIMS profiles comprising electrode material, a hybrid perovskite layer and a glass substrate (Figure S1, Supporting Information) shows the ToF‐SIMS 2D image of the space between the electrodes, including their edges, recorded for the PbI 3 negative secondary ion as a representative component of the hybrid halide perovskite . The upper and lower dark zones correspond to the gold electrodes, while the wide bright area in the middle displays the high intensity PbI 3 − signal.…”

Section: Resultsmentioning

confidence: 99%

“…The problem of a noble metal top electrode is widely discussed currently in the literature on the perovskite‐based devices, especially in mesoscopic solar cells without buffer underlayers . One of the important issues here appears to be downward (vertical) diffusion of metal atoms into the bulk of a photoabsorber layer, which leads to instability and loss in the devices performance.…”

Section: Discussionmentioning

confidence: 99%

“…The time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) was applied to investigate the chemical composition of the perovskite between the electrodes and of the electrodes proper. The standard ToF‐SIMS technique yields the depth profiles of the target chemical species and is, hence, widely used for studying perovskite‐based solar cells, which are essentially the sandwich‐type (vertical) hybrid structures . However, the reliability of the ToF‐SIMS profiling data obtained on such structures is in doubt due to the atomic mixing induced by the ion beam damage and roughening of the interfaces during sputter or analysis cycles .…”

Section: Introductionmentioning

confidence: 99%

“…However, the reliability of the ToF‐SIMS profiling data obtained on such structures is in doubt due to the atomic mixing induced by the ion beam damage and roughening of the interfaces during sputter or analysis cycles . More uncertainty comes with the downward diffusion of hot deposited metal atoms from the top electrode (and/or, sometimes, species from substrate), as thus‐appeared additional vertical atomic mixing can lead to misinterpretation of the profiles in organic/inorganic multilayer systems.…”

Section: Introductionmentioning

confidence: 99%

“…The lateral geometry, although somewhat distant from a real cell scheme, allows a more reliable and clear visualization of spatial distribution of the components, as well as a variety of microscopic methods to be used—see, e.g . Note that similar experiments on a planar Au/MAPbI 3 /Au system poled by a constant bias have demonstrated a discernible redistribution of chemical species at the microscopic level…”

Section: Introductionmentioning

confidence: 99%

See 4 more Smart Citations

Direct Imaging of Current‐Induced Transformation of a Perovskite/Electrode Interface

Дроздов

Yunin

Travkin

et al. 2019

Adv Materials Inter

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Formamidinium‐lead‐iodide (FAPbI3) perovskite films are subjected to a long‐term action of the constant electrical current in the dark, using planar vacuum‐deposited gold electrodes. The current‐induced transformation is monitored by the time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) mapping complemented by microscopic, spectroscopic methods, and X‐ray diffraction. The migration of chemical species inside the lateral interelectrode gap is clearly visualized by ToF‐SIMS. Those species correspond to both electrode material and perovskite itself, so that the perovskite/electrode interface becomes disrupted. As a result, the interelectrode gap shrinks, which is reflected in the surface images.

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Section: Resultsmentioning

confidence: 99%

Section: Discussionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

See 3 more Smart Citations

Direct Imaging of Current‐Induced Transformation of a Perovskite/Electrode Interface

Дроздов

Yunin

Travkin

et al. 2019

Adv Materials Inter

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Secondary Ion Mass Spectrometry (SIMS) for Chemical Characterization of Metal Halide Perovskites

Liu

Lorenz

Ievlev

et al. 2020

Adv Funct Materials

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Metal halide perovskite (MHP) solar cells have attracted much attention due to the rapidly growing power conversion efficiency that has reached 25.2% in a decade, comparable to established commercial photovoltaic modules. Compositional engineering is one of the most effective methods to boost the performance of MHP solar cells. Further improving the efficiency and the stability of MHP solar cells necessitates good understanding of the chemical–efficiency correlation and the chemical evolution during the degradation of MHP solar cells. In this regard, time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) is a powerful tool to investigate the chemical aspect of MHPs and has played an important role in advancing the development of MHP optoelectronics. However, up to date, a review that can guide future utilization of ToF‐SIMS in the MHP development is missing. Herein, the capabilities of ToF‐SIMS in MHP investigations are summarized and analyzed from simple material synthesis and chemical distribution to more complicated device operation mechanism and stability. The strength of ToF‐SIMS in resolving important issues in this field, such as interface composition, ion migration, and degradation in MHP is highlighted. Finally, an outlook with an emphasis on making the utmost of ToF‐SIMS in developing MHP devices is provided.

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Copper‐Based Corrole as Thermally Stable Hole Transporting Material for Perovskite Photovoltaics

Agresti

Berna

Pescetelli

et al. 2020

Adv Funct Materials

Self Cite

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Perovskite solar cells (PSCs) represent nowadays a promising starting point to develop a new efficient and low-cost photovoltaic technology due to the demonstrated power conversion efficiency (PCE) exceeding 25% on small area devices. However, best reported devices suffer from stability issue under real working conditions thus slowing down the race for the commercialization. In particular, the hole transporting material commonly employed in mesoscopic n-i-p PSCs (nip-mPSCs), namely spiro-OMeTAD, is strongly corrupted when subjected to temperatures above 70 °C due to intrinsic thermal instability and because of the dopant employed to improve the hole mobility. In this work, the novel use of a copper-based corrole as HTM is proposed to improve the device thermal stability of nip-mPSCs under prolonged 85 °C stress conditions. Corrole-based devices show remarkable PCE above 16% by retaining more than 65% of the initial PCE after 1000 h of thermal stress, while spiro-OMeTAD cells abruptly lose more than 60% after the first 40 h. Once scaled-up to large area modules, the proposed device structure can truly represent a possible way to pass thermal stress tests proposed by IEC-61646 standards and, not less importantly, the high temperature required by the lamination process for panel production.

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Aging effects in interface-engineered perovskite solar cells with 2D nanomaterials: A depth profile analysis

Cited by 51 publications

References 42 publications

Direct Imaging of Current‐Induced Transformation of a Perovskite/Electrode Interface

Direct Imaging of Current‐Induced Transformation of a Perovskite/Electrode Interface

Secondary Ion Mass Spectrometry (SIMS) for Chemical Characterization of Metal Halide Perovskites

Copper‐Based Corrole as Thermally Stable Hole Transporting Material for Perovskite Photovoltaics

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