Abstract:Ag/Co/B tri-doped TiO2/SiO2 film was prepared by the sol–gel method, and the structure and properties of this film were characterized by the X-ray diffraction (XRD), Brunauer–Emmett–Teller (BET) test method, field emission scanning electron microscopy (FE-SEM), differential thermal analysis-thermogravimetry (DTA-TG), photoluminescence (PL), and UV-visible diffuse reflectance spectrum (UV-vis DRS). XRD results indicated that the film structure of this film conforms to the anatase single crystal form. The presen… Show more
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