AES and XPS characterization of TiN Layers formed and modified by ion implantation

Abstract

Compositional characterization of sputtered and implanted titanium nitride (TiN) layers for microelectronics application is performed based on Auger Electron Spectroscopy (AES) and X-ray induced Photoelectron Spectroscopy (XPS) data. AES shows a strong overlapping of the most intensive peaks of Ti and N. A simple empirical method using intensity relations of Auger spectra is developed for quick estimation of layer composition in small areas. Defined modification of the TiN layers was realized by means of carbon and oxygen implantation to study their influence on quantitative analysis. In difference to standard AES analysis the results of quantification using the method proposed are found to be in good agreement with XPS profiles and with results from Principal Component Analysis (PCA), where peak overlapping is excluded. The influence of oxygen was found to be crucial for standard AES analysis but it could be taken into account in the proposed method. High carbon concentrations show no significant influence on the Ti and N peak shapes.

Stability and activity of titanium oxynitride thin films for the electrocatalytic reduction of nitrogen to ammonia at different pH values

“…1a), which was addressed by a procedure reported previously and described above in the Methods section. 26 Upon ∼40 min ambient exposure, oxidation is observed, with the presence of an oxygen peak and an AES-derived N/O atomic ratio of 0.7 (Fig. 1a).…”

“…Auger spectra were recorded at 3 keV incident electron beam energy. Due to the overlap in kinetic energy of the Ti (LMM) and N (KLL) peaks, the equation below was used to calculate the N/Ti atomic ratio as reported by Melnik et al 26 In the above equation, Ti(1) is the intensity of the overlapping Ti (LMM) and N (KLL) peaks; Ti(2) is the second Ti peak and α = Ti(2)/Ti(1) for pure Ti, and was found to be 0.8 for our installation.…”

“…Auger spectra were recorded at 3 keV incident electron beam energy. Due to the overlap in kinetic energy of the Ti (LMM) and N (KLL) peaks, the equation below was used to calculate the N/Ti atomic ratio as reported by Melnik et al 26…”