Advantages of Total Reflection X‐Ray Fluorescence Analysis Over Conventional Trace Analytical Techniques in Different Areas of Material Characterization

Abstract

Total reflection X‐ray fluorescence (TXRF) spectrometry, a variant of energy‐dispersive X‐ray fluorescence (EDXRF), has its detection limits comparable with conventional trace elemental determination techniques, e.g. inductively coupled plasma mass spectrometry (ICP‐MS) and inductively coupled plasma – atomic emission spectrometry (ICP‐AES). In addition, it has several advantages over these techniques, e.g. requirement of only a few microliters of sample (or picogram level of analytes), possibility of determination of metal and nonmetals alike, analysis of solids without dissolving (either rubbing on TXRF supports or making slurry), determination of low‐atomic‐number elements, and wide elemental range from C to Pu with modification of instrumental and sample preparation conditions. Due to these advantages, TXRF analysis is preferred over ICP‐MS or ICP‐AES in those areas where sample amount available is in minute quantity, dissolution of sample is difficult or not possible, sample dissolution is not preferred, or sample analysis is to be rechecked on same specimen in case of a doubt. There are several such studies reported on preferential application of TXRF in forensic, environmental, biological, agricultural, nuclear and several other areas. Some of these applications include analysis of gunshot residues (GSR), biological samples, and plutonium analysis for major and trace elements where sample amount available or preferred is very small. Similarly studies on TXRF applications for analysis of sintered (U,Th)O 2 pellets, soil samples, milk samples, tissue cells, etc. are also reported in various publications. Direct elemental analysis of environmental samples, e.g. aerosol particles, is another preferential area of TXRF spectrometry. Some of these studies are described in the present article.