Advances in manufacturing analysis: fractal theory in modern manufacturing

Mwema, Fredrick Madaraka; Akinlabi, Esther T.; Oladijo, Oluseyi Philip; Fatoba, O.S.; Akinlabi, Stephen A.; Ţălu, Ştefan

doi:10.1016/b978-0-12-819496-6.00002-6

Cited by 47 publications

(40 citation statements)

References 90 publications

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“…In addition to topography with real values of heights, AFM has a number of modes that make possible studying the electrical and mechanical properties of materials [32][33][34][35].…”

Section: Resultsmentioning

confidence: 99%

Crack resistance of bismuth ferrite films obtained on a flexible substrate

et al. 2021

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Ultrathin BiOx and FeOx layers were obtained by Atomic Layer Deposition (ALD) on the surface of a flexible Kapton substrate (poly (4,4’-oxydiphenylene-pyromellitimide)) at a temperature of 250 °C. The layer thickness was 50 - 100 nm. Surface morphology, electrical polarization, and mechanical properties were investigated by Atomic Force Microscope, Piezoelectric Force Microscopy and Force Modulation Microscopy. Chemical analysis was performed by X-ray Photoelectron Spectroscopy, where the formation of Bi2O3 and Fe2O3 phases, as well as intermediate phases in the Bi-Fe-O system, was observed. With a small increase in the Bi content of the film, the BFO / Kapton structure becomes more crack resistant. Modification of the Kapton surface with bismuth and iron oxides showed that such a composition exhibits multiferroic behavior.

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“…In addition to topography with real values of heights, AFM has a number of modes that make possible studying the electrical and mechanical properties of materials [32][33][34][35].…”

Section: Resultsmentioning

confidence: 99%

Crack resistance of bismuth ferrite films obtained on a flexible substrate

et al. 2021

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“…The averaged power spectral density (Mwema et al ., 2020) is also calculated from the matrix of values that gives the topography of the measured sample (Fig. 2).…”

Section: Resultsmentioning

confidence: 99%

Stereometric and fractal analysis of granulated silver films used in thin‐film hybrid structures

Ţălu

Shcherbinin

Konshina

et al. 2020

Journal of Microscopy

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Silver nanostructures are of interest to be used in hybrid thin-film structures with various materials. In this work, we analyse 3D AFM images of granulated silver film nanostructures prepared by thermal evaporation. The advanced AFM data study aims to understand how film thickness and postannealing affect the nanostructure morphology changes. For the first time, the evaluation of surface statistical parameters and fractal geometry were used to characterise the nanostructure morphology of Ag island films. The samples with gravimetric thickness of 2, 4 and 10 nm were analysed before and after annealing at 200°C for 10 min. The statistical processing revealed the essential variation of parameters with Ag film thickness increment and as a postannealing result. The nonmonotonic variation of surface roughness, skewness and fractal dimensions were found. It is caused by the features of the film growth process with the thickness increment and thermally activated diffusion of Ag nanoparticles during annealing.

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“…Over the last decades, various studies were performed about the 3-D (three-dimensional) surface microtexture of thin films that allow extracting different topographic characteristics quantitatively for new technological applications [13][14][15]. On the other hand, the microtexture of the 3-D surface can be characterized by stereometric [16][17][18], fractal [19][20][21], and multifractal [22][23][24][25] analyzes with a set of parameters that highlight the particular morphological characteristics of the surface. Atomic force microscopy (AFM), in combination with modern image processing techniques, offers advanced facilities for extracting particular topographic features of surfaces and highlights the local nanoscale configuration of 3-D complex surfaces [26][27][28].…”

Section: Introductionmentioning

confidence: 99%

Multifractal analysis of ZnO thin films doped with Mg deposited by sol-gel spin coating on a glass substrate

Ţălu

Boudour

Bouchama

et al. 2021

Preprint

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A multifractal analysis has been performed on the three-dimensional surface microtexture of the ZnO thin films doped with Mg deposited by sol-gel spin coating on glass substrates. The effects of Mg doping element with amounts of 0, 2, 4, and 5 % on structural and morphological properties of the coated films were investigated. From the X-ray diffraction pattern analysis, it was found that the obtained thin films had a polycrystalline hexagonal wurtzite structure with preferential c-axis orientation and increased grain size with increasing the Mg doping. From scanning electron microscopy (SEM) analysis, it can be concluded that the surface of coated thin films had dense and uniformly distributed grains of nanoscale without any cracks over all surfaces of coated firms. From atomic force microscope (AFM) analysis, it can be also concluded that the surface of coated thin films had a dense columnar grain growth uniformly distributed over the entire 1 µm ⋅ 1 µm - scanned area. The surface microtexture was characterized in terms of multifractal analysis.

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Advances in manufacturing analysis: fractal theory in modern manufacturing

Cited by 47 publications

References 90 publications

Crack resistance of bismuth ferrite films obtained on a flexible substrate

Crack resistance of bismuth ferrite films obtained on a flexible substrate

Stereometric and fractal analysis of granulated silver films used in thin‐film hybrid structures

Multifractal analysis of ZnO thin films doped with Mg deposited by sol-gel spin coating on a glass substrate

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