SIGGRAPH Asia 2015 Courses 2015
DOI: 10.1145/2818143.2818165
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Advances in geometry and reflectance acquisition (course notes)

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Cited by 51 publications
(40 citation statements)
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References 228 publications
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“…There is a recent survey by Schwartz et al [4] describing the options for measuring surface reflectance for computer graphics, including many details for the prototypes developed at the University of Bonn. Other older surveys are by Filip and Haindl [5], Weyrich et al [6] and Mueller et al [7], updated recently by Weinmann and Klein [8]. Most of the surface reflectance devices described in research papers, including those for measuring SVBRDF, utilise the Helmholtz reciprocity to halve the measurement time and sparsity of data.…”
Section: Related Workmentioning
confidence: 99%
See 1 more Smart Citation
“…There is a recent survey by Schwartz et al [4] describing the options for measuring surface reflectance for computer graphics, including many details for the prototypes developed at the University of Bonn. Other older surveys are by Filip and Haindl [5], Weyrich et al [6] and Mueller et al [7], updated recently by Weinmann and Klein [8]. Most of the surface reflectance devices described in research papers, including those for measuring SVBRDF, utilise the Helmholtz reciprocity to halve the measurement time and sparsity of data.…”
Section: Related Workmentioning
confidence: 99%
“…The colourimetric calibration was carried out using the set of four colour calibration certified standards from Edmund Optics (red, green, blue, and yellow patch, the product number #56-079). The colourimetric calibration was carried out as described by Weinmann et al [8] and Schwartz et al [4]. …”
Section: Data Acquisition and Calibrationmentioning
confidence: 99%
“…We focus this overview on related work that shares some of the goals of our method: in-situ appearance acquisition, appearance modeling under natural lighting with unknown shape, recovering meso-structure, and exploiting chromatic cues for scene modeling. For a detailed overview of appearance modeling we refer to [DRS08,WK15].…”
Section: Related Workmentioning
confidence: 99%
“…For the introduction to this topic, we refer to the recent surveys by Weinmann et al . [WK15], Schwartz et al . [SSW*14], Haindl and Filip [HF13] and Dana [Dan16].…”
Section: Related Workmentioning
confidence: 99%