2010
DOI: 10.1109/tmag.2010.2042041
|View full text |Cite
|
Sign up to set email alerts
|

Advances and Future Prospects of Spin-Transfer Torque Random Access Memory

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1

Citation Types

0
180
0

Year Published

2014
2014
2023
2023

Publication Types

Select...
6
3

Relationship

0
9

Authors

Journals

citations
Cited by 346 publications
(189 citation statements)
references
References 16 publications
0
180
0
Order By: Relevance
“…(1) to (3). We obtain χ yy directly from fitting the spectra, the damping and g ↑↓ from the linear fits to the data in Fig.…”
Section: The 180mentioning
confidence: 99%
“…(1) to (3). We obtain χ yy directly from fitting the spectra, the damping and g ↑↓ from the linear fits to the data in Fig.…”
Section: The 180mentioning
confidence: 99%
“…The phenomenon of spin transfer torque (STT) [1][2][3], in which a spin-polarized current transfers angular momentum to a magnetic layer, has brought about novel applications such as spin torque oscillators (STOs) [4][5][6][7] and spin transfer torque magnetoresistive random access memory (STT-MRAM) [8][9][10]. While initially based on magnetic materials with in-plane (IP) magnetic anisotropy, the realization that such materials lead to unnecessarily high STT-MRAM switching currents, poor memory retention, poor scalability [11], and high-field operation of STOs [12], there is now a rapidly growing interest in fabricating STT devices based on perpendicular magnetic anisotropy (PMA) materials.…”
mentioning
confidence: 99%
“…However, it is hampered by several reliability issues due to the unique characteristic of its data storage element, Magnetic Tunnel Junction (MTJ). On the one hand, the switching behavior between two states is stochastic and mainly affected by applied current intensity [1], which leads to some write errors [2], read disturbances and hold errors [3]. On the other hand, the low (tunnel magnetoresistance) TMR ratios and resistance of MTJ increase the influence of PVT variations, especially from the access transistors [4].…”
Section: Introductionmentioning
confidence: 99%
“…On the other hand, the low (tunnel magnetoresistance) TMR ratios and resistance of MTJ increase the influence of PVT variations, especially from the access transistors [4]. Several designs including error detecting circuits, auxiliary circuits, memory cells and sense amplifiers have been proposed to solve those issues in recent years [5].…”
Section: Introductionmentioning
confidence: 99%