Advancements in metrology for advanced semiconductor packaging
Wei-Hsin Chein,
Gaurav Pandey,
Surajit Das
et al.
Abstract:In the wake of continuous miniaturization, optical metrology has solidified its role as an essential instrument in semiconductor manufacturing, chiefly due to its non-invasive, high-precision, and rapid measurement capacities. Particularly crucial in advanced techniques such as automated optical inspection (AOI), its significance grows with the rising demand for accurate 3D integrated circuit packaging characterization. This introduces notable challenges for optical metrology, which need addressing to meet rig… Show more
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