Advancement and challenges in sample preparation for atomic force microscopy and infrared microscopy for wood‐based materials

Abstract

Wood-based materials such as composites or laminates play an important role in today's furniture industry, especially in manufacturing high-quality kitchen and dining room furniture. One important aspect after fabrication is the investigation of these materials to derive quality metrics such as surface stain and scuff resistance. Current sample preparation methods are mostly straightforward and rely on cutting and grinding the materials under test, including sensitive wood substrates. To investigate cross-sections and different layer topologies, characterisation techniques such as atomic force microscopy (AFM) and infrared (IR) microscopy are of potential interest. However, a huge limitation is that current sample preparation methods lead to smeared coatings on the sample cross-sections and high surface roughness. Hence, these methods are not applicable for the sample preparation in measuring AFM and IR microscopy. Therefore, new preparation techniques need to be developed accordingly. This article presents a new approach towards coated wood-based sample preparation including embedding processes to use those samples for AFM and IR microscopy technologies. The proposed method has been evaluated by obtaining AFM, IR and microscopy measurements of more than four different wood-based samples such as (i) raw paper, (ii) impregnated paper, (iii) melamine-coated chipboards and (iv) medium-density fibreboards. The investigation results showed a significant improvement in sample preparation, as well as clear chemical and physical characterisation over whole sample construction, including coating layers, for wood-based materials.