2021
DOI: 10.1039/d1qm00969a
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Advanced XPS characterization: XPS-based multi-technique analyses for comprehensive understanding of functional materials

Abstract: X-ray photoelectron spectroscopy (XPS) has achieved maturity as an analytical technique in that it is a ubiquitous tool in the materials community, however as made apparent by recent reviews highlighting...

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Cited by 64 publications
(41 citation statements)
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References 382 publications
(370 reference statements)
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“…While there are so far few examples for the use of GCIS in battery research, it offers promise due to its ability to sputter etch soft materials without leaving much chemical damage. 81,82 This is a result of using large clusters of argon atoms (up to several thousand atoms) with large incident energies (up to tens of thousands eV), giving a low average energy per atom. The low energy prevents significant chemical damage, but the large clusters allow for the removal of material from the sample at appreciable rates (though often not so high rate as for monatomic sputter etching).…”
Section: Ion Sputter Etchingmentioning
confidence: 99%
“…While there are so far few examples for the use of GCIS in battery research, it offers promise due to its ability to sputter etch soft materials without leaving much chemical damage. 81,82 This is a result of using large clusters of argon atoms (up to several thousand atoms) with large incident energies (up to tens of thousands eV), giving a low average energy per atom. The low energy prevents significant chemical damage, but the large clusters allow for the removal of material from the sample at appreciable rates (though often not so high rate as for monatomic sputter etching).…”
Section: Ion Sputter Etchingmentioning
confidence: 99%
“…XPS is well known as a method for the analysis of the chemical structure and composition of surfaces since it may examine a depth profile of ca. some nanometers . However, such examination depth is on the order of the size of the SiNPs herein studied.…”
Section: Resultsmentioning
confidence: 97%
“…some nanometers. 35 However, such examination depth is on the order of the size of the SiNPs herein studied. Therefore, the surface or body location of observed chloro iminium siloxyl-like functionalities cannot be ascertained.…”
Section: ■ Experimental Sectionmentioning
confidence: 99%
“…As an example, the deconvolution of the C 1s spectral region can be used to assess the ratio of the C–C/CC, C–O/C–N, and CO/CN groups and verify how this varies with some parameters in CND preparation . It should be pointed out, however, that due to the typical size of CNDs, XPS measurements may provide information due to both the nanoparticle core and surface. , …”
Section: In Silico Methods For Cnd Studiesmentioning
confidence: 99%
“…34 It should be pointed out, however, that due to the typical size of CNDs, XPS measurements may provide information due to both the nanoparticle core and surface. 434,435 2.3.1.7. Nuclear Magnetic Resonance Spectroscopy.…”
Section: Building Cnd Model Structuresmentioning
confidence: 99%