1993
DOI: 10.1007/bf00693512
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Advanced x-ray detectors for the analysis of materials

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Cited by 14 publications
(6 citation statements)
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“…8 Energy dispersive spectrometry ͑EDS͒ is typically limited to a 150 eV resolution and a 20 kHz count rate for 6 keV x rays. The minimum detectability limit goes as the square root of the ratio of the energy resolution to the count rate.…”
Section: ͑3͒mentioning
confidence: 99%
“…8 Energy dispersive spectrometry ͑EDS͒ is typically limited to a 150 eV resolution and a 20 kHz count rate for 6 keV x rays. The minimum detectability limit goes as the square root of the ratio of the energy resolution to the count rate.…”
Section: ͑3͒mentioning
confidence: 99%
“…There is an obvious need for new generations of X-ray spectrometers for microanalysis that combine the excellent energy resolution of WD spectrometers with the parallel energy detection capability of semiconductor ED spectrometers. Recently, high-energy-resolution X-ray microcalorimeter spectrometers for improved EDS X-ray microanalysis have been proposed (Lesyna et al, 1993;Nahum & Martinis, 1995;Silver et al, 1996) and demonstrated Wollman et al, 1996;Silver et al, 1997;Wollman et al, 1997a).…”
Section: Introductionmentioning
confidence: 99%
“…This has been used to obtain the heat capacity of silicon at low temperatures. [45] The greater spectral resolution and efficiency of low temperature calorimeters, when compared with the more conventional solid state detectors [46], are to be exploited at the Gesellschaft für Schwerionenforschung (GSI) facility in Darmstadt (Germany) for precision Lamb-shift measurements. [47] For hydrogen-like lead and uranium (atomic numbers Z=82 and 92), the principal quantum number n=2 and 1 levels are separated by ≈ 100 keV, the n=2 fine structure ≈ 4.6 keV, and the Lamb shifts are 458 eV and 75 eV for the 1s and 2s electrons.…”
Section: Resultsmentioning
confidence: 99%