2016
DOI: 10.1364/ao.55.002126
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Advanced materials for multilayer mirrors for extreme ultraviolet solar astronomy

Abstract: We provide an analysis of contemporary multilayer optics for extreme ultraviolet (EUV) solar astronomy in the wavelength ranges: λ=12.9-13.3  nm, λ=17-21  nm, λ=28-33  nm, and λ=58.4  nm. We found new material pairs, which will make new spaceborne experiments possible due to the high reflection efficiencies, spectral resolution, and long-term stabilities of the proposed multilayer coatings. In the spectral range λ=13  nm, Mo/Be multilayer mirrors were shown to demonstrate a better ratio of reflection efficienc… Show more

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Cited by 73 publications
(32 citation statements)
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“…86 Additionally, such ML has been demonstrated to have good stability over time. [87][88][89] Recent research has been oriented to develop techniques for further improving the Al/Zr performance. The adoption of a 1% Si-doping Al layer was proposed for increasing the reflectance peak: 88 this small concentration of Si highly affects the crystallization of both Al and Zr layers with a consequent decrease of the interface roughness.…”
Section: Al-based Euv ML Structuresmentioning
confidence: 99%
“…86 Additionally, such ML has been demonstrated to have good stability over time. [87][88][89] Recent research has been oriented to develop techniques for further improving the Al/Zr performance. The adoption of a 1% Si-doping Al layer was proposed for increasing the reflectance peak: 88 this small concentration of Si highly affects the crystallization of both Al and Zr layers with a consequent decrease of the interface roughness.…”
Section: Al-based Euv ML Structuresmentioning
confidence: 99%
“…Mo/Si 30 54 0 875 Al/Mo/SiC 5 6 53.4 0 76 Al/Mo/B 4 C 5 6 55.5 0 875 Zr/Al 31 56 0 6 Si/Al 10 48 0 48 R = 55.5%, = 0.875 nm, and Mo/Al/SiC-R = 53.4%, = 0.76 nm. The Zr/Al MLM has better resolution with comparable reflection coefficient: R = 56%, = 0.6 nm.…”
Section: Mlm R % Nmmentioning
confidence: 99%
“…Therefore, when developing and synthesizing a MLM for future space experiments, it becomes necessary to find the optimal ratio of the spectral selectivity and the reflection coefficient. Ideally, it is required to maintain or even exceed the high coefficients of existing MLM for solar astronomy, [4][5][6][7][8][9][10] and to increase their spectral selectivity.…”
Section: Introductionmentioning
confidence: 99%
“…При этом по мощности EUV-луча Xe источник, как минимум, не будет усту-пать источнику на основе Sn, превосходя последний по " чистоте" и инженерной простоте. Ранее литография на длине волны λ = 11.2 nm считалась невозможной из-за отсутствия зеркал для этой длины волны, но сейчас первые в мире образцы Mo/Be-зеркал, пригодных для работы на λ = 11.2 nm, уже созданы [5].…”
Section: поступило в редакцию 7 июля 2017 гunclassified