Advanced large area characterization of thin-film solar modules by electroluminescence and thermography imaging techniques

Gerber, Andreas; Huhn, Vito; Tran, Thi Minh Hang; Siegloch, M.; Augarten, Y.; Pieters, Bart E.; Rau, Uwe

doi:10.1016/j.solmat.2014.09.020

Cited by 54 publications

(33 citation statements)

References 20 publications

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“…Therefore, both categories can be classified as one type of crack. This result is different from the results explained in [7,8] because all the measured data in our experiments were taken from a real-time long-term environmental measurements instead of laboratory under controlled climate conditions. Based on the proposed statistical approach, the T-test values for all examined diagonal crack PV modules (12 PV modules) are shown in Table II.…”

Section: A Case Study 1 : Diagonal Crackcontrasting

confidence: 73%

“…Electroluminescence (EL) imaging method is used to scan the surface of the PV modules, the light output increases with the local voltage so that regions with poor contact show up as dark spots [6]. The thermography technique is simpler to implement, but the accuracy of the image is lower than with the EL technique, and does not allow the estimation of the area (in mm 2 ) that is broken in the solar cells [7]. Therefore, the image technique used in this work is based on EL imaging method which also is illustrated and discussed briefly in the work of Berardone et al [8] and Spataru et al [9].…”

Section: Introductionmentioning

confidence: 99%

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The impact of cracks on the performance of photovoltaic modules

Dhimish

Holmes

Dales

et al. 2017

2017 IEEE Manchester PowerTech

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Abstract-This paper presents a statistical approach for identifying the significant impact of cracks on the output power performance of photovoltaic (PV) modules. Since there are a few statistical analysis of data for investigating the impact of cracks in PV modules in real-time long-term data measurements. Therefore, this paper will demonstrate a statistical approach which uses two statistical techniques: T-test and F-test. Electroluminescence (EL) method is used to scan possible cracks in the examined PV modules. Moreover, virtual instrumentation (VI) LabVIEW software is used to predict the theoretical output power performance of the examined PV modules based on the analysis of I-V and P-V curves. The statistical analysis approach has been validated using 45 polycrystalline PV modules at the University of Huddersfield, UK.

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Section: A Case Study 1 : Diagonal Crackcontrasting

confidence: 73%

Section: Introductionmentioning

confidence: 99%

The impact of cracks on the performance of photovoltaic modules

Dhimish

Holmes

Dales

et al. 2017

2017 IEEE Manchester PowerTech

View full text Add to dashboard Cite

show abstract

“…By contrast, electroluminescence (EL) measurements can obtain spatially resolved information inside solar cells and are more suitable for the characterization of nonuniform solar cells. For example, EL imaging techniques are suitable for shunt analysis of industrial‐sized CIGS thin‐film modules, and for the quantitative analysis of the local electrical cell properties . The intrinsic and extrinsic defects in Si solar cells can be distinguished via two EL images at different temperatures .…”

Section: Introductionmentioning

confidence: 99%

Absolute electroluminescence imaging with distributed circuit modeling: Excellent for solar‐cell defect diagnosis

Hong

Wang

Chen

et al. 2019

Progress in Photovoltaics

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Spatially resolved absolute electroluminescence (EL) imaging demonstrates the localized EL intensity and the uniformity of solar cells. Combined with two‐dimensional (2‐D) distributed circuit network modeling, detailed and important information that is contained in experimental data can be extracted for in‐depth understanding of solar cell performances. Herein, we measured the absolute EL images of three different solar cells (Si, GaAs, and Cu (In,Ga)Se2 (CIGS)) and observed the different injection‐current‐dependent EL intensities of the defect points (dark or bright) on the solar cells. The origins of these defects were attributed to different defect types according to our established 2‐D distributed equivalent circuit model. The results demonstrated that the combination of absolute EL imaging and distributed circuit modeling yielded accurate quantitative diagnoses of the electrical defects in solar cells.

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“…We choose the electroluminescence (EL) and dark lock-in thermography (DLIT) as spatially resolved measurement techniques, which have proven to be suitable for the characterization of defects [3]- [5]. We first investigate scribing defects with a comprehensive set of line interruption lengths L ranging from single micrometer to several millimeters, and we present in detail the appearance of the scribing line failures within the different ranges.…”

Section: Introductionmentioning

confidence: 99%

Defect Diagnostics of Scribing Failures and Cu-Rich Debris in Cu(In,Ga)Se<inline-formula><tex-math>$_2$ </tex-math></inline-formula> Thin-Film Solar Modules With Electroluminescence and Thermography

Misic

Pieters

Schweitzer

et al. 2015

IEEE J. Photovoltaics

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We study the appearance of both scribing failures and Cu-rich debris, formed during Cu(In,Ga)Se 2 (CIGS) coevaporation, in electroluminescence (EL) and dark lock-in thermography (DLIT) images. We observe that for most of the defect types, there is a characteristic appearance of EL and DLIT that allows reliable diagnostics. We also point to defect scenarios where different defects appear similar. With regard to scribing defects, we find that the reliability of defect identification increases with the length of the line interruption, while for Cu-rich debris, we find that the geometrical size and position within the cell significantly determine its defect appearance and, therefore, the ability to diagnose it.

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Advanced large area characterization of thin-film solar modules by electroluminescence and thermography imaging techniques

Cited by 54 publications

References 20 publications

The impact of cracks on the performance of photovoltaic modules

The impact of cracks on the performance of photovoltaic modules

Absolute electroluminescence imaging with distributed circuit modeling: Excellent for solar‐cell defect diagnosis

Defect Diagnostics of Scribing Failures and Cu-Rich Debris in Cu(In,Ga)Se<inline-formula><tex-math>$_2$ </tex-math></inline-formula> Thin-Film Solar Modules With Electroluminescence and Thermography

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