2015
DOI: 10.1107/s2052252514024178
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Advanced grazing-incidence techniques for modern soft-matter materials analysis

Abstract: The complex nano-morphology of modern soft-matter materials is successfully probed with advanced grazing-incidence techniques. Based on grazing-incidence small-and wide-angle X-ray and neutron scattering (GISAXS, GIWAXS, GISANS and GIWANS), new possibilities arise which are discussed with selected examples. Due to instrumental progress, highly interesting possibilities for local structure analysis in this material class arise from the use of micro-and nanometer-sized X-ray beams in micro-or nanofocused GISAXS … Show more

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Cited by 227 publications
(241 citation statements)
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References 140 publications
(172 reference statements)
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“…From this, the form and structure factors of scattering domain sizes are extracted. [ 21 ] Figure 3 shows the form factors as well as the structure factors dependent on (fl uoro)surfactant content in the fi lm. In total, three form and corresponding structure factors are observed within the measured range.…”
Section: Inner Film Morphologymentioning
confidence: 99%
“…From this, the form and structure factors of scattering domain sizes are extracted. [ 21 ] Figure 3 shows the form factors as well as the structure factors dependent on (fl uoro)surfactant content in the fi lm. In total, three form and corresponding structure factors are observed within the measured range.…”
Section: Inner Film Morphologymentioning
confidence: 99%
“…The interaction of X-rays with scattering domains inside the film is simulated by form and structure factors that translate to domain shapes and their distances in real space. [17][18][19][20] Grazing-incidence wide angle X-ray scattering (GIWAXS) probes length scales down to the atomic range and thus yields crystallographic information about the crystalline part of the sample. Reflexes in the scattering pattern stem from crystal planes denoted in the reciprocal lattice by Miller indices (hkl) and give information about crystal phase and orientation with respect to the substrate surface normal.…”
Section: Research Newsmentioning
confidence: 99%
“…In this respect, advanced X-ray and neutron scattering techniques were proven to be of particular value, since they allow for a non-destructive nanostructure determination without any need for special sample preparation. [74][75][76] …”
Section: Wwwadvancedsciencenewscommentioning
confidence: 99%