Advanced characterization of electrodeposition-based high efficiency solar cells: Non-destructive Raman scattering quantitative assessment of the anion chemical composition in Cu(In,Ga)(S,Se)2 absorbers

Raman scattering quantitative assessment of the anion composition ratio in Zn(O,S) layers for Cd-free chalcogenide-based solar cells

“…Raman scattering is a powerful nondestructive tool very sensitive to both the atomic composition and the crystal quality of the layers, and has already been reported for the quantitative composition analysis of chalcogenide semiconductors, including the assessment of the S/(S + Se) content ratio in sulfo-selenide alloys from the CIGS, CZTS and Zn(S,Se) systems. [9][10][11] Raman scattering analysis of Zn(O,S) solid solutions has already been reported in ref. [12][13][14][15].…”

Pulsed Electrochemical Deposition of CuInSe2 and Cu(In,Ga)Se2 Semiconductor Thin Films

“…In addition, a less intense peak corresponding to A 1 mode of Cu 2−x Se at 260 cm −1 is found in case of DC electrodeposited CIGS thin film. The copper rich composition in DC plated CIGS films facilitated the formation of the Cu 2−x Se phase, which is generally dispersed on the surface [84,87]. PC electrodeposition with suitable optimization of parameters aided control over the composition of elements and eliminated Cu 2−x Se phase.…”

On the identification of Sb2Se3 using Raman scattering

“…The researchers have turned their attention to Raman scattering (RS) as a powerful technique to provide qualitative information about the crystal phase of chalcogenides materials 12,13 . RS is widely used for the identification of main and secondary phases of chalcogenide materials as it is a non-destructive technique and allows for very fast interpretations.…”