Advanced Analysis of Cell Stability for Reliable SRAM PUFs

Hosey, Alison; Rahman, Mostafizur; Xiao, Kun; Forte, Domenic; Tehranipoor, Mohammad

doi:10.1109/ats.2014.70

Cited by 25 publications

(14 citation statements)

References 17 publications

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“…In this section, we explain SRAM PUFs' neighborhoodbased dependency observed in [8,9]. We explore the reasons of correlation among neighbor cells.…”

Section: Sram Puf Reliabilitymentioning

confidence: 99%

“…Thus, the NICSA-based algorithm helps us to ease off the ECC scheme. The proposed NICSA offers better BER and reliability for an aged device than fresh because aged SRAM cells might become more dependent on their neighborhood [9]. Besides, the proposed NICSA-based approach can find the optimized threshold unlike [8].…”

Section: Advantage Of Choosing Uncorrelated Cellsmentioning

confidence: 99%

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Systematic Correlation and Cell Neighborhood Analysis of SRAM PUF for Robust and Unique Key Generation

et al. 2017

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A physical unclonable function (PUF) is a structure that produces a unique response, with an issued challenge (input), which can be used as an identifier or a cryptographic key. SRAM PUFs create unique responses upon power up as certain SRAM cells output a "1" or "0" with high probability due to uncontrollable process variations. A current challenge in SRAM PUFs is their sensitivity to temperature and voltage variations as well as aging. It is always challenging to make SRAM PUFs reliable and unique with algorithms that isolate stable and uncorrelated bits quickly with minimal testing (enrollment). In this paper, we explore the selection of stable and uncorrelated bits through enrollment under different conditions (temperature and voltage) and also by exploiting previously undiscovered interactions between neighboring SRAM cells. We propose University of Connecticut, Storrs, CT, USA neighbor influenced cell selection algorithm (NICSA) with the help of metrics that analyze the impact of each neighboring cell and each enrollment condition. The proposed NICSA helps to identify the "best" cells and conditions for stable bit selection. Besides reliability, SRAM PUF can be less unique due to systematic correlation among chips. We study the systematic correlation between SRAMs power-up values to find the uncorrelated cells among chips for better uniqueness. We have analyzed data from 5 ISSI, 3 IDT, and 3 Cypress SRAMs and our metrics identify the best neighborhood size (16 stable neighbors) and best enrollment condition pair high temperature, high voltage, and low temperature for NICSA.

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“…In this section, we explain SRAM PUFs' neighborhoodbased dependency observed in [8,9]. We explore the reasons of correlation among neighbor cells.…”

Section: Sram Puf Reliabilitymentioning

confidence: 99%

Section: Advantage Of Choosing Uncorrelated Cellsmentioning

confidence: 99%

Systematic Correlation and Cell Neighborhood Analysis of SRAM PUF for Robust and Unique Key Generation

et al. 2017

Self Cite

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“…SRAM schemes gave rise also to some work about counteracting aging. In [27] presents some anti-aging techniques which are based on data-dependent aging effects, while [28] develops new metrics to analyze the relationship of reliability between neighboring SRAM cells. Said metrics are used to examine in detail the impact of environment.…”

Section: A Prior Workmentioning

confidence: 99%

“…Aging is another important issue since it could happen that with time the cell will change its PO [27], [28]. We carried out some aging simulations with Relxpert.…”

Section: Agingmentioning

confidence: 99%

Analytic and Simulation Results about a Compact, Reliable, and Unbiased 1-bit Physically Unclonable Constant

Bernardini

Rinaldo

2016

IEEE Trans.Inform.Forensic Secur.

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Abstract-Physically Unclonable Constants (PUC) are circuits used to embed unique secret bit-words in chips. We propose a simple PUC, with a complexity comparable with an SRAM cell. The proposed scheme is studied both theoretically and by means of simulations and it is shown that the proposed PUC is both unbiased and very stable. In particular, its intra-distance is predicted to be from 10 to 100 times smaller than competitor schemes. Simulations allow to conclude that the advantages of the proposed scheme are relevant enough to make it competitive even if the actual performance of a real implementation, not considered in this paper, will turn out to be an order of magnitude worse than predicted.

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“…The device ID (ID l ) is created from the on-chip SRAM (extensive desription and analysis of SRAM PUF can be found in [59][60][61][62][63]) of the ED. Now, the ED encrypts ID l using N bits of computed H. The encrypted ID {r i } is sent to the gateway for authentication.…”

mentioning

confidence: 99%

A Robust, Low-Cost and Secure Authentication Scheme for IoT Applications

Mahmod

Guin

2020

Cryptography

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The edge devices connected to the Internet of Things (IoT) infrastructures are increasingly susceptible to piracy. These pirated edge devices pose a serious threat to security, as an adversary can get access to the private network through these non-authentic devices. It is necessary to authenticate an edge device over an unsecured channel to safeguard the network from being infiltrated through these fake devices. The implementation of security features demands extensive computational power and a large hardware/software overhead, both of which are difficult to satisfy because of inherent resource limitation in the IoT edge devices. This paper presents a low-cost authentication protocol for IoT edge devices that exploits power-up states of built-in SRAM for device fingerprint generations. Unclonable ID generated from the on-chip SRAM could be unreliable, and to circumvent this issue, we propose a novel ID matching scheme that alleviates the need for enhancing the reliability of the IDs generated from on-chip SRAMs. Security and different attack analysis show that the probability of impersonating an edge device by an adversary is insignificant. The protocol is implemented using a commercial microcontroller, which requires a small code overhead. However, no modification of device hardware is necessary.

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Advanced Analysis of Cell Stability for Reliable SRAM PUFs

Cited by 25 publications

References 17 publications

Systematic Correlation and Cell Neighborhood Analysis of SRAM PUF for Robust and Unique Key Generation

Systematic Correlation and Cell Neighborhood Analysis of SRAM PUF for Robust and Unique Key Generation

Analytic and Simulation Results about a Compact, Reliable, and Unbiased 1-bit Physically Unclonable Constant

A Robust, Low-Cost and Secure Authentication Scheme for IoT Applications

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