2006
DOI: 10.1016/j.susc.2006.03.024
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Adsorption of short-chain alkanethiols on Ag(111) studied by direct recoiling spectroscopy

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Cited by 18 publications
(17 citation statements)
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References 50 publications
(107 reference statements)
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“…In Figure , the affinity level of F – measured with respect to the vacuum level is approximately at E a = −3.399 eV. As the distance between the projectile of F and the surface decreases, the affinity level shifts downward through the image-potential effect and broadens, and crosses the Fermi level of the clean Cu(110) surface (work function W = 4.49 eV) approximately at 6.2 atomic unit, which enhances the resonant electron capture from the occupied metallic states. Departing from the surface, resonant ionization takes place when the affinity level is above the Fermi level.…”
Section: Resultsmentioning
confidence: 95%
See 1 more Smart Citation
“…In Figure , the affinity level of F – measured with respect to the vacuum level is approximately at E a = −3.399 eV. As the distance between the projectile of F and the surface decreases, the affinity level shifts downward through the image-potential effect and broadens, and crosses the Fermi level of the clean Cu(110) surface (work function W = 4.49 eV) approximately at 6.2 atomic unit, which enhances the resonant electron capture from the occupied metallic states. Departing from the surface, resonant ionization takes place when the affinity level is above the Fermi level.…”
Section: Resultsmentioning
confidence: 95%
“…The scattered Ar­(S) and the recoiling H­(DR), O­(DR) particles are all recorded using a 16 mm-diameter MCP detector set at a distance of 1.41 m from the scattering center at the end of a TOF analysis tube. In the pulsed beam mode, the low incident Ar + current (about 10 –12 A) hitting the surface produces negligible damage to the adsorbed layer as has been amply demonstrated in the literature. …”
Section: Methodsmentioning
confidence: 90%
“…In this work, we study the adsorption kinetics of the EP-PTCDI molecules by means of TOF-DRS, a technique that has been proven to yield useful information for other organic molecules like alkanethiols on Ag, 25 where a more complex adsorption process, consisting on different adsorption stages, was found. Panel a of Fig.…”
Section: Resultsmentioning
confidence: 99%
“…During sputtering the sample was kept under continuous rotation around its normal in order to change the azimuthal incidence angle. 24,25 The quality of the surface was verified by TOF-DRS, given that the spectra taken 151 incidence and at more grazing angles (51) are very sensitive to surface cleanness and the atomic order.…”
Section: Methodsmentioning
confidence: 99%
“…In comparison to the backscattering geometry DRS has a lower mass resolution and a higher contribution from multiple scattering collisions. The advantages enumerated above have made of TOF-DRS an interesting technique to study adsorption phenomena, for atoms and in particular for organic molecules adsorbed at surfaces [6]. In this report we describe the instrument developed at the Surface Science Group in Bariloche which combines both back (ion scattering) and forward (direct recoil) spectroscopies with other techniques including Micro Channel Plate -Low Energy Electron Diffraction (MCP-LEED), Ultraviolet Photoelectron Spectroscopy (UPS), Auger (AES) and High Resolution Energy Loss Spectroscopy (EELS).…”
Section: -Introductionmentioning
confidence: 99%