2006
DOI: 10.1016/j.tsf.2005.08.168
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Adsorption–desorption isotherms of nanoporous thin films measured by X-ray reflectometry

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Cited by 17 publications
(12 citation statements)
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“…In this context, XRR can be a suitable method to determine NP inclusion, for it allows the simultaneous and direct determination of density, thickness, and interfacial roughness of thin films from the reflectivity intensity variations with the X‐ray incident angle 27, 28. Recently, XRR was used to monitor capillary condensation of various solvents in meso‐ and nanostructured silica films,29–32 and the metal volume fraction of Au–ceramic nanocomposite films produced by co‐sputtering 33. XRR constitutes a simple and accurate method compared to ellipsometry.…”
Section: Resultsmentioning
confidence: 99%
“…In this context, XRR can be a suitable method to determine NP inclusion, for it allows the simultaneous and direct determination of density, thickness, and interfacial roughness of thin films from the reflectivity intensity variations with the X‐ray incident angle 27, 28. Recently, XRR was used to monitor capillary condensation of various solvents in meso‐ and nanostructured silica films,29–32 and the metal volume fraction of Au–ceramic nanocomposite films produced by co‐sputtering 33. XRR constitutes a simple and accurate method compared to ellipsometry.…”
Section: Resultsmentioning
confidence: 99%
“…X-Ray reflectometry (XRR) can be used to independently obtain the parameters obtained by EP. [84][85][86] The reflectivity critical angle q c allows a direct determination of the film electronic density; film thickness is separately obtained from the Kiessig interference fringes. This information, combined with the results for dense films can be used to determine the accessible and the total film porosity (Fig.…”
Section: Determination Of Film Porosity: Ellipsometric Porosimetry (Ementioning
confidence: 99%
“…In particular, the study of the interaction between solvents and mesoporous materials requires specific techniques that can detect small changes in the properties of the thin film during its contact with the solvent. For this purpose, ellipsometric porosimetry has been developed, and X-ray reflectivity was adapted. In both cases, dedicated equipment is required to perform the measurements.…”
Section: Introductionmentioning
confidence: 99%