Abstract:A narrow-bezel display is preferred by geological researchers for endowing intelligent navigation terminals with the desired large screen. Etching residues of indium tin oxide (ITO) induce electrostatic breakdown of the unit of the gate driver on the array (GOA), and cause the screen to suffer from abnormal display. In this work, adjusting the photoresist curing temperature is proposed to reduce the electrostatic breakdown. Five ITO films with different crystal structures are prepared at varied curing temperat… Show more
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