2020
DOI: 10.1109/jlt.2020.2969097
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Adjoint Optimization of Efficient CMOS-Compatible Si-SiN Vertical Grating Couplers for DWDM Applications

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Cited by 18 publications
(24 citation statements)
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“…The refractive index of SiN x is approximately 2.03, which is slightly lower than that of GaN (2.29). However, SiN x is more conducive to CMOS processing [179,180]. This characteristic gives SiN-based metasurfaces the potential for mass production.…”
Section: Sin-based Metasurfacesmentioning
confidence: 99%
“…The refractive index of SiN x is approximately 2.03, which is slightly lower than that of GaN (2.29). However, SiN x is more conducive to CMOS processing [179,180]. This characteristic gives SiN-based metasurfaces the potential for mass production.…”
Section: Sin-based Metasurfacesmentioning
confidence: 99%
“…In recent years, novel design methodologies based on inverse design and machine learning have been proposed to reduce coupling losses in GCs while respecting fabrication constraints present in, e.g. available deep ultra violet (DUV) lithography process flows [7][8][9][10][11][12][13][14]. Interestingly, these more advanced design techniques facilitate the usage of more degrees of freedom in the design, allowing designers to go beyond traditional single-layer, single-etch designs and leverage dual etch [10,[14][15][16][17][18][19][20][21], dual layer fabrication flows [7,11,[22][23][24][25].…”
Section: Introductionmentioning
confidence: 99%
“…available deep ultra violet (DUV) lithography process flows [7][8][9][10][11][12][13][14]. Interestingly, these more advanced design techniques facilitate the usage of more degrees of freedom in the design, allowing designers to go beyond traditional single-layer, single-etch designs and leverage dual etch [10,[14][15][16][17][18][19][20][21], dual layer fabrication flows [7,11,[22][23][24][25]. Additionally, reduction in the minimal feature size would allow the usage of sub-wavelength (SWL) features [19,20,[26][27][28], although not all recent SWL designs are compatible with the constraints of scalable DUV immersion lithography [26].…”
Section: Introductionmentioning
confidence: 99%
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