2002
DOI: 10.1163/156856102760146147
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Adhesion improvement of electroless copper to a polyimide film substrate by combining surface microroughening and imide ring cleavage

Abstract: In order to enhance the adhesion strength of copper metal lm to a polyimide (PI) lm substrate, a method combining surface microroughness formation and imide ring cleavage was investigated. The results showed that imide rings were cleaved with a KOH treatment while carboxyl and amide groups were formed on the surface of the PI lm. The surface micro-roughness did not change with the KOH treatment, and the adhesion strength of the copper metal lm to the PI lm was slightly improved to 30 g/ mm, which could be attr… Show more

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Cited by 55 publications
(34 citation statements)
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“…The surface microroughness can induce mechanical interlocking as well as produce a greater surface area for chemical interactions between the components of the interface. 8 Table I shows the surface roughness data for different pretreatment conditions. To understand the fracture mode, it is essential to study the fracture surface along with the peel test data.…”
Section: Resultsmentioning
confidence: 99%
“…The surface microroughness can induce mechanical interlocking as well as produce a greater surface area for chemical interactions between the components of the interface. 8 Table I shows the surface roughness data for different pretreatment conditions. To understand the fracture mode, it is essential to study the fracture surface along with the peel test data.…”
Section: Resultsmentioning
confidence: 99%
“…The PI films were washed with distilled water after each step. The chemical composition of the electroless copper plating solution was the same as that in the literature [18], and the compositions are shown in Table 1. The pH of the solution was adjusted to 11.5 using NaOH, and the bath temperature was 70 ∘ C. After electroless plating for 40 min, the PIs were electroplated with copper at room temperature with a current density of 0.03 A/cm 2 for 1 h. The copper layer was deposited at a thickness of 20 m. After annealing at 100 ∘ C for 120 min in an oven, the copper-coated PI films were cut into 10 mm × 40 mm strips.…”
Section: Methodsmentioning
confidence: 99%
“…The surfaces of PI films are commonly modified through plasma treatment [5][6][7][8][9][10], ion implantation [11,12], chemical treatment [13][14][15][16][17][18], and UV/ozone treatment [19][20][21]. However, physical processes, such as plasma and ion implantation, require expensive equipment and are thus associated with high investment costs.…”
Section: Introductionmentioning
confidence: 99%
“…10,11 ELD Cu is often considered as a method for depositing a seed layer and has previously been applied for the deposition of Cu on printed circuit boards using a Pd catalyst system. [12][13][14] Furthermore, it is attractive for replacing conventional PVD Cu seed layers in dual-damascene fabrication of Cu interconnects. [15][16][17][18] Recently, we reported a feasibility study for TSV metallization seed layer using Ru as catalytic underlayer for ELD Cu.…”
mentioning
confidence: 99%