2017
DOI: 10.1088/1361-6463/aa5626
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Adducing crystalline features from Raman scattering studies of cubic SiC using different excitation wavelengths

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Cited by 8 publications
(1 citation statement)
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“…The phonon correlation length L is used to measure the average distance between point defects (Ferreira et al, 2010) to describe the crystal quality (Havel et al, 2004). The intensity of the first-order Raman spectrum I(ω) can be deduced from the spatial correlation model of the Gaussian distribution function as (Chuan, 2000;Ferreira et al, 2010;Havel et al, 2004;Chen et al, 2017):…”
Section: Analysis Of the Spatial Correlation Theorymentioning
confidence: 99%
“…The phonon correlation length L is used to measure the average distance between point defects (Ferreira et al, 2010) to describe the crystal quality (Havel et al, 2004). The intensity of the first-order Raman spectrum I(ω) can be deduced from the spatial correlation model of the Gaussian distribution function as (Chuan, 2000;Ferreira et al, 2010;Havel et al, 2004;Chen et al, 2017):…”
Section: Analysis Of the Spatial Correlation Theorymentioning
confidence: 99%