2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC) 2016
DOI: 10.1109/pvsc.2016.7749739
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Addressing adhesion and reliability concerns of copper-plated c-Si solar cells and modules

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“…Furthermore, the EL images do not show signs of R S increase or contact detachment via weak adhesion, which is a common concern in Cu‐plated cells. Therefore we do not believe weak Cu‐contact adhesion is a contributing factor in these samples (which we previously observed to have similar adhesion to Ag‐screenprinted contacts 33 …”
Section: Resultsmentioning
confidence: 68%
“…Furthermore, the EL images do not show signs of R S increase or contact detachment via weak adhesion, which is a common concern in Cu‐plated cells. Therefore we do not believe weak Cu‐contact adhesion is a contributing factor in these samples (which we previously observed to have similar adhesion to Ag‐screenprinted contacts 33 …”
Section: Resultsmentioning
confidence: 68%