2021
DOI: 10.1016/j.addma.2021.101898
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Additively manufactured ultra-high vacuum chamber for portable quantum technologies

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Cited by 27 publications
(16 citation statements)
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“…The surface profilometry measurements determined an arithmetic average wall roughness of R a = 5.9 µm. While this wall roughness is comparable to recent work in additively manufactured vacuum chambers 16 , it remains orders of magnitude larger than the wall roughness achievable for DRIE, with short etch depths (≤100 µm) achieving R a = 5 nm, 8,17 and deep etched silicon (1.4 mm) demonstrating R a = 300 nm 18 . In future applications, chemical smoothing of the inner walls can be applied if the wall roughness is found to hinder the atomic vapor cell's long-term performance.…”
Section: Fabrication and Set-upsupporting
confidence: 61%
“…The surface profilometry measurements determined an arithmetic average wall roughness of R a = 5.9 µm. While this wall roughness is comparable to recent work in additively manufactured vacuum chambers 16 , it remains orders of magnitude larger than the wall roughness achievable for DRIE, with short etch depths (≤100 µm) achieving R a = 5 nm, 8,17 and deep etched silicon (1.4 mm) demonstrating R a = 300 nm 18 . In future applications, chemical smoothing of the inner walls can be applied if the wall roughness is found to hinder the atomic vapor cell's long-term performance.…”
Section: Fabrication and Set-upsupporting
confidence: 61%
“…The outlook towards further miniaturisation of the system is very favourable with additively manufactured vacuum chambers now demonstrating pressure levels compatible with cold-atom systems. 16,17 This raises the possibility of the cavity also acting as the vacuum chamber, negating one of the largest factors in the SWaP budget of the current system. We believe this work is another crucial step towards the realisation portable cold-atom frequency standards for the next generation of compact time keeping.…”
Section: Discussionmentioning
confidence: 99%
“…In [1,2] UHV applications were considered and LPBF manufacturing technology was used, but direct UHV characterisation like vacuum tests was not investigated. On the other hand, in literature [3][4][5][6] not only LPBF was used, but also vacuum tightness was positively tested against UHV requirements. Even more, in [3,6] outgassing rate was monitored.…”
Section: Introductionmentioning
confidence: 99%
“…On the other hand, in literature [3][4][5][6] not only LPBF was used, but also vacuum tightness was positively tested against UHV requirements. Even more, in [3,6] outgassing rate was monitored. However, AlSi10Mg, Ni-5Mo-15Fe alloy and 316L materials were used instead of pure copper.…”
Section: Introductionmentioning
confidence: 99%