“…The wt.% of C and O in the orthopedic implants was determined using a carbon/sulfur analyzer (CS–800, ELTRA GmbH, Germany) and an oxygen/nitrogen analyzer (ON–900, ELTRA GmbH) with a sensitivity of 0.01 ppm and an accuracy of ±0.1 ppm for a sample of 1.0 g. [ 49 ] The amounts of TiO 2 and HA were measured and calculated from the test results using inductively coupled plasma‐optical emission spectrometry (ICP‐OES; Optima 7300DV, PerkinElmer, USA). [ 50 ] The surface morphologies and chemical compositions of the filaments, plain substance, composites, and hybrid composites were examined with scanning electron microscopy (SEM; JSM–6701F, JEOL, Japan) equipped with energy‐dispersive X‐ray spectrometry (EDS) for elemental analysis. [ 51 ] The samples were prepared via a focused ion beam (AURIGA, Carl Zeiss, Germany) to investigate the distribution and thickness of the TiO 2 agglomeration and HA coating on the PEEK substance.…”