Addition of third elements to Co-Cr media

敏明, 経徳; 順, 有明; 直樹, 本多; 一弘, 大内; 俊一, 岩崎

doi:10.3379/jmsjmag.19.s2_6

Cited by 12 publications

(16 citation statements)

References 7 publications

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“…Magnetic force microscopy measurements performed by Keitoku et al [72] showed domain sizes of 90-95 nm for 15-and 30-nm-thick Co 0.61 Cr 0.13 Pt 0.26 films, and larger domains of ≈250 nm for 10-nm-thick films. In this case, the domain structures were unaffected by the MFM tip due to high coercivity (≈1 kOe) of the alloy.…”

Section: Resultsmentioning

confidence: 99%

Domain-wall structure in thin films with perpendicular anisotropy: Magnetic force microscopy and polarized neutron reflectometry study

et al. 2014

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Ferromagnetic domain patterns and three-dimensional domain-wall configurations in thin CoCrPt films with perpendicular magnetic anisotropy were studied in detail by combining magnetic force microscopy and polarized neutron reflectometry with micromagnetic simulations. With the first method, lateral dimension of domains with alternative magnetization directions normal to the surface and separated by domain walls in 20-nm-thick CoCrPt films were determined in good agreement with micromagnetic simulations. Quantitative analysis of data on reflectometry shows that domain walls consist of a Bloch wall in the center of the thin film, which is gradually transformed into a pair of Néel caps at the surfaces. The width and in-depth thickness of the Bloch wall element, transition region, and Néel caps are found consistent with micromagnetic calculations. A complex structure of domain walls serves to compromise a competition between exchange interactions, keeping spins parallel, magnetic anisotropy orienting magnetization normal to the surface, and demagnetizing fields, promoting in-plane magnetization. It is shown that the result of such competition strongly depends on the film thickness, and in the thinner CoCrPt film (10 nm thick), simple Bloch walls separate domains. Their lateral dimensions estimated from neutron scattering experiments agree with micromagnetic simulations.

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Section: Resultsmentioning

confidence: 99%

Domain-wall structure in thin films with perpendicular anisotropy: Magnetic force microscopy and polarized neutron reflectometry study

et al. 2014

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“…In 2001, Keitoku [21] found 30 nm CoCrPt media was further improved by the use of (1 1 1) textured 10 nm NiFe seed layer on 5 nm Ti called a stacked layer on CoZrNb SUL which has H c ¼ 5000 Oe; S ¼ 1; H k ¼ 11000 Oe; H n ¼ À2500 Oe; but the 95 nm magnetic cluster domain size is too large for obtaining high SNR.…”

Section: Double-layer Cocrptmentioning

confidence: 99%

“…For the C under layer thickness=0, 5, 10, 60 nm, the H c ¼ 1900; 2000, 4200, 5200 Oe, H n ¼ À1600; À1700, À4000, À4200 Oe, a ¼ 12; 12,9.6,3.8,and SNR=4,8.8,10.5,21 dB at 200 kbpi. The results of MFM images indicate increasing the C underlayer significantly decreases the magnetic exchange interactions and reduces the size of magnetic cluster domains to lower transition noise.…”

Section: Fcc Co/pd Multilayer Mediamentioning

confidence: 99%

Advancements in PMR thin-film media

Judy

2005

Journal of Magnetism and Magnetic Materials

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“…Since the SUL has an amorphous structure, there is a need for intermediate layers which can induce a HCP(0 0 2) orientation in the Coalloy recording layers. Ruthenium (Ru) is widely used as the intermediate layer along with some seedlayers such as Ta and Pt [3][4][5][6]. However, with an amorphous SUL, the thickness of the intermediate layers needed to provide a good HCP(0 0 2) orientation could be high.…”

Section: Introductionmentioning

confidence: 99%