2020
DOI: 10.1109/access.2020.3022275
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Adaptive Abstraction-Level Conversion Framework for Accelerated Discrete-Event Simulation in Smart Semiconductor Manufacturing

Abstract: Speeding up the simulation of discrete-event wafer-fabrication models is essential for fast decision-making to handle unexpected events in smart semiconductor manufacturing because decisionparameter optimization requires repeated simulation execution based on the current manufacturing situation. In this paper, we present a runtime abstraction-level conversion approach for discrete-event fab models to gain simulation speedup. During the simulation, if the fab's machine group model reaches a steady state, then t… Show more

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Cited by 5 publications
(1 citation statement)
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“…Thus, when the simulation is repeated for parameter exploration, unnecessary time overhead is accumulated for the model having the same verification result. The constant time overhead from full RTL simulation for edge processor encourage research in different levels of abstraction or highlevel modeling [1]- [4].…”
Section: Introductionmentioning
confidence: 99%
“…Thus, when the simulation is repeated for parameter exploration, unnecessary time overhead is accumulated for the model having the same verification result. The constant time overhead from full RTL simulation for edge processor encourage research in different levels of abstraction or highlevel modeling [1]- [4].…”
Section: Introductionmentioning
confidence: 99%