Adapting an XCT-scanner to enable edge illumination X-ray phase contrast imaging

Abstract

Conventional X-ray computed tomography (XCT) is a non-destructive imaging technique to visualize and inspect the internal structure of materials in 3D, where materials are distinguished solely on the basis of their attenuation coefficient. However, with more specialized X-ray phase contrast imaging methods, sensitivity to complementary contrasts can be achieved, namely phase contrast and dark field contrast. Edge illumination X-ray phase contrast imaging (EI-XPCI) is a technique that is especially suited for laboratory application, because it has no strict coherence requirements for the source. While there is a wide variety of XCTscanners available on the market, a commercial EI-XPCI scanner does not yet exist. In this work, we present the procedure of outfitting an existing XCT-scanner with components to enable EI-XPCI scans and discuss the alignment procedure of these added components. Finally, phase contrast images are shown demonstrating the successful upgrade of a conventional XCT system with edge illumination based phase contrast possibilities.